ENGRMSE 264 Scanning Electron Microscopy (2014-2015)

ENGRMSE 264 Scanning Electron Microscopy

(Not required for any major.)
Catalog Data:

ENGRMSE 264 Scanning Electron Microscopy (Credit Units: 4) The theory and operation of the scanning electron microscope (SEM) and X-ray microanalysis. Topics covered include the basic design and electron optics, electron beam - specimen interactions, image formation and interpretation, X-ray spectrometry, and other related topics and techniques. Prerequisite: MSE 200. Graduate students only. (Design units: 0)

Required Textbook:
None
Recommended Textbook:
None
References:
None
Coordinator:
Relationship to Student Outcomes
No student outcomes specified.
Course Learning Outcomes. Students will:
Prerequisites by Topic
Lecture Topics:

None.

Class Schedule:

Meets for 3 hours of lecture and 2 hours of laboratory each week for 10 weeks.

Computer Usage:
Laboratory Projects:
Professional Component
Design Content Description
Approach:
Lectures:
Laboratory Portion:
Grading Criteria:
Estimated ABET Category Content:

Mathematics and Basic Science: 0.0 credit units

Computing: 0.0 credit units

Engineering Topics: 0.0 credit units

Engineering Science: 0.0 credit units

Engineering Design: 0.0 credit units

Prepared:
April 15, 2014
Senate Approved:
April 29, 2013
Approved Effective:
2013 Fall Qtr