EECS 275B Very Large Scale Integration (VLSI) Project Testing (2016-2017)

EECS 275B Very Large Scale Integration (VLSI) Project Testing

(Not required for any major.)
Catalog Data:

EECS 275B Very Large Scale Integration (VLSI) Project Testing (Credit Units: 4) Test and document student-created Complementary Metal Oxide Semiconductor (CMOS) Very Large Scale Integration (VLSI) projects designed in EECS 275A. Emphasis on practical laboratory experience in VLSI testing techniques. Prerequisite: EECS275A. Graduate students only. (Design units: 0)

Required Textbook:
None
Recommended Textbook:
None
References:
None
Coordinator:
Relationship to Student Outcomes
No student outcomes specified.
Course Learning Outcomes. Students will:
Prerequisites by Topic
Lecture Topics:

None.

Class Schedule:

Meets for 3 hours of lecture and 3 hours of laboratory each week for 10 weeks.

Computer Usage:
Laboratory Projects:
Professional Component
Design Content Description
Approach:
Lectures:
Laboratory Portion:
Grading Criteria:
Estimated ABET Category Content:

Mathematics and Basic Science: 0.0 credit units

Computing: 0.0 credit units

Engineering Topics: 0.0 credit units

Engineering Science: 0.0 credit units

Engineering Design: 0.0 credit units

Prepared:
July 12, 2016
Senate Approved:
April 26, 2013
Approved Effective:
2013 Fall Qtr