EECS 170LA Electronics I Laboratory (2016-2017)

EECS 170LA Electronics I Laboratory

(Required for CpE and EE. Selected Elective for MSE.)
Catalog Data:

EECS 170LA Electronics I Laboratory (Credit Units: 1) Laboratory accompanying EECS 170A to perform experiments on semiconductor material properties, semiconductor device physics and operation principles, and transistor amplifiers to improve experimental skills and to enhance the understanding of lecture materials. Corequisite: EECS170A, Physics 7E. Prerequisite: EECS70B, Physics 7D. Computer Engineering, Electrical Engineering, and Materials Science Engineering majors have first consideration for enrollment. (Design units: 1)

Required Textbook:
. Edition, , 1969, ISBN-13 978-0073529585.

Recommended Textbook:
. Edition, , 1969, ISBN-13 978-0201543933.

References:
None
Coordinator:
Ozdal Boyraz
Relationship to Student Outcomes
No student outcomes specified.
Course Learning Outcomes. Students will:

1. Use modern electronic equipment.

2. Characterize semiconductor diodes and transistors.

3. Build basic RC circuits and measure them.

4. Design, build, and measure a single-stage transistor amplifier.

5. Interpret measurement data and write clear laboratory reports.

Prerequisites by Topic

Calculus, fundamental electromagnetic theory, fundamental atomic physics, basic quantum mechanics, and fundamental circuit analysis.

Lecture Topics:

None.

Class Schedule:

Meets for 3 hours of laboratory each week for 10 weeks.

Computer Usage:

Computers are used extensively to communicate with equipment and to grab and store data for further processing and print out.

Laboratory Projects:
  • Introduction and equipment operations.
  • Soldering technique and RC filters.
  • Characterization of semiconductors.
  • Characterization of P-N junction and Schottky diodes.
  • Transient responses of diodes.
  • Characterization of bipolar junction transistors and MOSFETs.
  • Bipolar junction and MOS transistors as switches.
  • Bipolar junction transistor amplifier.
Professional Component

Contributes toward the Computer Engineering Topics Courses and Electrical Engineering Topics Courses.

Design Content Description
Approach:

Six of the eight experiments are devoted to design of: technique for measuring the impulse and frequency responses of RC circuits; measurement techniques of p-n junction diodes and Schottky diodes; technique for measuring the input and output characteristics of bipolar junction transistors; inverter circuits; and single-stage transistor amplifier.

Lectures: 0%
Laboratory Portion: 100%
Grading Criteria:
  • Lab reports: 50%
  • Quiz: 50%
  • Total: 100%
Estimated ABET Category Content:

Mathematics and Basic Science: 0.0 credit units

Computing: 0.0 credit units

Engineering Topics: 1.0 credit units

Engineering Science: 0.0 credit units

Engineering Design: 1.0 credit units

Prepared:
July 12, 2016
Senate Approved:
April 29, 2013
Approved Effective:
2013 Fall Qtr