CBEMS 164 X-Ray Diffraction, Electron Microscopy, and Microanalysis (2012-2013)

CBEMS 164 X-Ray Diffraction, Electron Microscopy, and Microanalysis

(Required for MSE. Selected Elective for ME.)
Catalog Data:

CBEMS 164 X-Ray Diffraction, Electron Microscopy, and Microanalysis (Credit Units: 4) Material characterization using x-ray diffraction and scanning electron microscopy (SEM). Topics include x-ray diffraction and analysis; SEM imaging and microanalysis. Prerequisite: ENGR54; CBEMS50L. Materials Science Engineering majors have first consideration for enrollment. (Design units: 1)

Required Textbook:
. Edition, , 1969, ISBN-13 978-0199546459.

. Edition, , 1969, ISBN-13 978-0306472923.

Recommended Textbook:
None
References:

A course website will be established.

Coordinator:
Daniel R. Mumm
Relationship to Student Outcomes
No student outcomes specified.
Course Learning Outcomes. Students will:
Prerequisites by Topic

Introductory Materials Science laboratory (CBEMS 50L)

Lecture Topics:
  • Review of the crystallography of simple structures, Miller indices, the stereographic projection, pole figures, and inverse pole figures.
  • The history of diffraction and microscopy as material characterization techniques. The limitations of light microscopy.
  • Diffraction theory, x-ray diffraction (XRD) reciprocal space and the structure factor.
  • X-ray generation, the x-ray diffractometer and modes of operation. Specimen preparation for XRD.
  • The powder diffraction file database and its use..
  • A high level introduction to the scanning electron microscope instrument and its imaging modes.
  • Specimen preparation overview for different experimental goals.
  • Electron beam / specimen interactions.
  • Signals available for image generation (SE, BSE, cathodoluminescence etc).
  • The instrument in detail (electron guns, electron optics, vacuum requirements, specimen stages, detectors, scanning systems and displays, image recording systems).
  • The image, image interpretation, digital image processing, systematic image archiving.
  • Microanalysis in the SEM – an introduction to energy dispersive x-ray spectroscopy (EDS).
  • Strategies for SEM imaging and choosing operating parameters (accelerating voltage, beam current, apertures, working distance, etc.) to maximize information content of data recorded.
  • Auger spectroscopy, X-ray photoelectronic spectroscopy and Electron backscatter Diffraction (EBSD).
Class Schedule:

Meets for 3 hours of lecture and 3 hours of laboratory each week for 10 weeks.

Computer Usage:

Computer literacy and basic skills are required for performing analysis using software.

Laboratory Projects:

3 hours per week, exercises designed to (1) examine and develop expertise with primary SEM imaging and microanalysis modes, and (2) explore x-ray diffraction techniques and carry out identification of unknowns by powder x-ray diffraction approaches.

Professional Component

Provides students with an understanding of the role of material characterization in engineering materials development.

Design Content Description
Approach:

Selection of materials to meet design requirement such as strength and durability.

Lectures: 0%
Laboratory Portion: 100%
Grading Criteria:
  • Laboratory reports 20%
  • Midterm Exam 20%
  • Final Exam 60%
  • Total: 100%
Estimated ABET Category Content:

Mathematics and Basic Science: 0.0 credit units

Computing: 0.0 credit units

Engineering Topics: 4.0 credit units

Engineering Science: 3.0 credit units

Engineering Design: 1.0 credit units

Prepared:
June 17, 2013
Senate Approved:
January 10, 2012
Approved Effective:
2012 Fall Qtr