CBEMS 164 X-Ray Diffraction, Electron Microscopy, and Microanalysis (2012-2013)

CBEMS 164 X-Ray Diffraction, Electron Microscopy, and Microanalysis

(Required for MSE. Selected Elective for ME.)
Catalog Data:

CBEMS 164 X-Ray Diffraction, Electron Microscopy, and Microanalysis (Credit Units: 4) Material characterization using x-ray diffraction and scanning electron microscopy (SEM). Topics include x-ray diffraction and analysis; SEM imaging and microanalysis. Prerequisite: ENGR54; CBEMS50L. Materials Science Engineering majors have first consideration for enrollment. (Design units: 1)

Required Textbook:
. Edition, , 1969, ISBN-13 978-0199546459.

. Edition, , 1969, ISBN-13 978-0306472923.

Recommended Textbook:

A course website will be established.

Daniel R. Mumm
Relationship to Student Outcomes
No student outcomes specified.
Course Learning Outcomes. Students will:
Prerequisites by Topic

Introductory Materials Science laboratory (CBEMS 50L)

Lecture Topics:
  • Review of the crystallography of simple structures, Miller indices, the stereographic projection, pole figures, and inverse pole figures.
  • The history of diffraction and microscopy as material characterization techniques. The limitations of light microscopy.
  • Diffraction theory, x-ray diffraction (XRD) reciprocal space and the structure factor.
  • X-ray generation, the x-ray diffractometer and modes of operation. Specimen preparation for XRD.
  • The powder diffraction file database and its use..
  • A high level introduction to the scanning electron microscope instrument and its imaging modes.
  • Specimen preparation overview for different experimental goals.
  • Electron beam / specimen interactions.
  • Signals available for image generation (SE, BSE, cathodoluminescence etc).
  • The instrument in detail (electron guns, electron optics, vacuum requirements, specimen stages, detectors, scanning systems and displays, image recording systems).
  • The image, image interpretation, digital image processing, systematic image archiving.
  • Microanalysis in the SEM – an introduction to energy dispersive x-ray spectroscopy (EDS).
  • Strategies for SEM imaging and choosing operating parameters (accelerating voltage, beam current, apertures, working distance, etc.) to maximize information content of data recorded.
  • Auger spectroscopy, X-ray photoelectronic spectroscopy and Electron backscatter Diffraction (EBSD).
Class Schedule:

Meets for 3 hours of lecture and 3 hours of laboratory each week for 10 weeks.

Computer Usage:

Computer literacy and basic skills are required for performing analysis using software.

Laboratory Projects:

3 hours per week, exercises designed to (1) examine and develop expertise with primary SEM imaging and microanalysis modes, and (2) explore x-ray diffraction techniques and carry out identification of unknowns by powder x-ray diffraction approaches.

Professional Component

Provides students with an understanding of the role of material characterization in engineering materials development.

Design Content Description

Selection of materials to meet design requirement such as strength and durability.

Lectures: 0%
Laboratory Portion: 100%
Grading Criteria:
  • Laboratory reports 20%
  • Midterm Exam 20%
  • Final Exam 60%
  • Total: 100%
Estimated ABET Category Content:

Mathematics and Basic Science: 0.0 credit units

Computing: 0.0 credit units

Engineering Topics: 4.0 credit units

Engineering Science: 3.0 credit units

Engineering Design: 1.0 credit units

June 17, 2013
Senate Approved:
January 10, 2012
Approved Effective:
2012 Fall Qtr